Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams / Kun Yuan, Vi-Nhuan Le.

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Bibliographic Details
Online Access: Full text (Open Access)
Main Authors: Yuan, Kun (Author), Le, Vi-Nhuan (Author)
Format: Electronic eBook
Language:English
Published: Santa Monica, CA : RAND Corporation, [2014]
Series:Research report (Rand Corporation)
Subjects:
Local Note:JSTOR

MARC

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